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Título del libro: Photocatalytic Semiconductors: Synthesis, Characterization, And Environmental Applications
Título del capítulo: Electrochemical characterization of photocatalytic materials

Autores UNAM:

Autores externos:

Idioma:
Inglés
Año de publicación:
2015
Palabras clave:

Characterization; Electrochemistry; Electron transitions; Fermi level; Films; Interface states; Interfaces (materials); Metals; Nanocrystalline materials; Nanocrystals; Photocurrents; Quantum efficiency; Quantum yield; Semiconductor junctions; Semiconductor materials; Electrochemical techniques; Flat band; Flat band potential; Photo-anodes; Photo-electrocatalysis; Photo-voltage; Photonic efficiencies; Schottky; Semiconductor electrolyte interfaces; Electrolytes


Resumen:

The semiconductor?electrolyte interface have interesting similarities and differences with their semiconductor?metal (or metal oxide) and metal?electrolyte counterparts. Thus, approaches to garnering a fundamental understanding of these interfaces have stemmed from both electrochemistry and solid-state physics perspectives and have proven to be equally fruitful. Electron transfer theories were also rapidly evolving during this period, starting from homogeneous systems to heterogeneous metal?electrolyte interfaces leading, in turn, to semiconductor?electrolyte junctions. To facilitate a self-contained description, this chapter will start with well-established aspects related to the thermodynamic properties as semiconductor energy band model and the electrostatics at semiconductor?electrolyte interfaces in the dark. Additionally, this chapter examines the kinetic properties in the processes of light absorption, electron?hole generation, and charge separation at these interfaces. The steady state and dynamic aspects of charge transfer are then briefly considered. Nanocrystalline semiconductor films and size quantization are then discussed as are issues related to electron transfer across chemically modified semiconductor?electrolyte interfaces to determine the photocatalytic efficiency of semiconductor materials. © Springer International Publishing Switzerland 2015.


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