1 | From Graphene Oxide to N-Doped Graphene: Understanding the Doping Process | Coautor: Murillo-Bracamontes, EA, Ruiz-Marizcal, JM, Paez-Ornelas, JI, Fernández-Escamilla, HN, et al. | 2025 | Advanced Energy And Sustainability Research | WoS-id: 001389889300001 Scopus-id: 2-s2.0-105001724689
| 0 | 0 |
2 | Magnetic-Dielectric Cantilevers for Atomic Force Microscopy | Coautor: Murillo-Bracamontes, EA, Sanchez-Seguame, G, Avalos-Sanchez, H, Lugo, JE, et al. | 2024 | NANOMATERIALS | WoS-id: 001231470800001 Scopus-id: 2-s2.0-85194228348
| 1 | 1 |
3 | Enabling high-quality transparent conductive oxide on 3D printed ZrO2 architectures through atomic layer deposition | Coautor: Murillo-Bracamontes, Edurado A., Arriaga Dávila J., Winczewski, Jedrzej P., Herrera-Zaldivar, Manuel, et al. | 2023 | APPLIED SURFACE SCIENCE | WoS-id: 001037048800001 Scopus-id: 2-s2.0-85163875368
| 12 | 13 |
4 | Contact resonance frequencies and their harmonics in scanning probe microscopy | 1ᵉʳ autor: Murillo-Bracamontes, Eduardo A., Gervacio-Arciniega, Juan J., Cruz-Valeriano, Edgar, Enriquez-Flores, I, Christian, et al. | 2021 | IET SCIENCE MEASUREMENT & TECHNOLOGY | WoS-id: 000619536700001 Scopus-id: 2-s2.0-85101451186
| 3 | 3 |
5 | Understanding the Role of Oxygen Vacancies in the Stability of ZnO(0001)-(1 x 3) Surface Reconstructions | Coautor: Murillo-Bracamontes, E., Paez-Ornelas, I, J., Ponce-Perez, R., Fernandez-Escamilla, H. N., et al. | 2021 | JOURNAL OF PHYSICAL CHEMISTRY C | WoS-id: 000641307100045 Scopus-id: 2-s2.0-85104914404
| 12 | 10 |
6 | The effect of shape and size in the stability of triangular Janus MoSSe quantum dots | Coautor: Murillo-Bracamontes, E. A., Paez-Ornelas, I, J., Ponce-Perez, R., Fernandez-Escamilla, H. N., et al. | 2021 | SCIENTIFIC REPORTS | WoS-id: 000711622600068 Scopus-id: 2-s2.0-85118342169
| 7 | 8 |
7 | YSZ thin film nanostructured battery for on-chip energy storage applications | Coautor: Murillo E., Lizarraga E., Read J., Solorio F., et al. | 2020 | Journal of Energy Storage | WoS-id: 000530627500010 Scopus-id: 2-s2.0-85078142680
| 12 | 12 |
8 | Design of Concentric Ring Antenna Arrays Based on Subarrays to Simplify the Feeding System | Coautor: Murillo, Eduardo, Juarez, Elizvan, Panduro, Marco A., Reyna, Alberto, et al. | 2020 | Symmetry-Basel | WoS-id: 000550791300001 Scopus-id: 2-s2.0-85089196791
| 10 | 11 |
9 | Piezoresponse force microscopy imaging and its correlation with cantilever spring constant and frequency | 2ᵒ autor: Murillo-Bracamontes, E. A., Solis Canto, O., Gervacio-Arciniega, J. J., Toledo-Solano, M., et al. | 2020 | JOURNAL OF APPLIED PHYSICS | WoS-id: 000565316500001 Scopus-id: 2-s2.0-85090089298
| 1 | 2 |
10 | Erratum: Piezoresponse force microscopy imaging and its correlation with cantilever spring constant and frequency (Journal of Applied Physics (2020) 128 (084101) DOI: 10.1063/5.0013287) | 2ᵒ autor: Murillo-Bracamontes, E. A., Solis Canto, O., Gervacio-Arciniega, J. J., Toledo-Solano, M., et al. | 2020 | JOURNAL OF APPLIED PHYSICS | WoS-id: 000585808400002 Scopus-id: 2-s2.0-85094681018
| 0 | 0 |
11 | Discrimination of a ferroelectric from a non-ferroelectric response in PFM by phase analyses at the harmonics of the applied Vac | 2ᵒ autor: Murillo-Bracamontes, E. A., Gervacio-Arciniega, J. J., Toledo-Solano, M., Fuentes, J., et al. | 2020 | JOURNAL OF APPLIED PHYSICS | WoS-id: 000619258500001
| 2 | 0 |
12 | Reducing the Number of Phase Shifters in Circular Arrays of Circular Subarrays for a Wide-Scanning Pattern | Coautor: Murillo, Eduardo, Juarez, Elizvan, Panduro, Marco A., Reyna, Alberto, et al. | 2019 | IEEE Antennas and Propagation Society International Symposium | WoS-id: 000657207103072
| 1 | 0 |
13 | Multiferroic YCrO 3 thin films: Structural, ferroelectric and magnetic properties | 2ᵒ autor: Murillo-Bracamontes, E., Gervacio-Arciniega, J. J., Contreras, O., Siqueiros, J. M., et al. | 2018 | APPLIED SURFACE SCIENCE | WoS-id: 000415219100081 Scopus-id: 2-s2.0-85029395263
| 6 | 7 |
14 | Dielectric constant measurement using atomic force microscopy of dielectric films: a system theory approach | Coautor: Murillo-Bracamontes, E. A., Cruz-Valeriano, E., Guzman-Caballero, D. E., Escamilla-Diaz, T., et al. | 2018 | APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | WoS-id: 000443942300002 Scopus-id: 2-s2.0-85053016286
| 4 | 5 |
15 | Physical and electrical characterization of yttrium-stabilized zirconia (YSZ) thin films deposited by sputtering and atomic-layer deposition | Coautor: Murillo, Eduardo, Molina-Reyes, Joel, Tiznado, Hugo, Soto, Gerardo, et al. | 2018 | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | WoS-id: 000444200300011 Scopus-id: 2-s2.0-85044057918
| 19 | 20 |
16 | Poole-Frenkel Conduction Mechanism in ZnO:N Nanobelts | 2ᵒ autor: Murillo, Eduardo, Carrera-Gutierrez, Karime, Rivero, Ignacio, Herrera-Zaldivar, Manuel | 2018 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | WoS-id: 000446839100013 Scopus-id: 2-s2.0-85054861467
| 4 | 4 |
17 | An alternative scheme to measure single-point hysteresis loops using piezoresponse force microscopy | Coautor: Murillo-Bracamontes, E., Flores-Ruiz, F. J., Gervacio-Arciniega, J. J., Cruz, M. P., et al. | 2017 | Measurement | WoS-id: 000404201400015 Scopus-id: 2-s2.0-85019846244
| 8 | 7 |
18 | Structural and electrical characterization of multilayer Al2O3/ZnO nanolaminates grown by atomic layer deposition | Coautor: Murillo, E., Martinez-Castelo, J. R., Lopez, J., Dominguez, D., et al. | 2017 | MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING | WoS-id: 000412963700043 Scopus-id: 2-s2.0-85027567036
| 17 | 17 |
19 | Thickness effect on the optical and morphological properties in Al2O3/ZnO nanolaminate thin films prepared by atomic layer deposition | Coautor: Murillo, E., Lopez, J., Martinez, J., Abundiz, N., et al. | 2016 | SUPERLATTICES AND MICROSTRUCTURES | WoS-id: 000370312800031 Scopus-id: 2-s2.0-84952765304
| 22 | 25 |
20 | Implementation of Hough Transform for fruit image segmentation | 1ᵉʳ autor: Murillo-Bracamontes E.A., Martinez-Rosas M.E., Miranda-Velasco M.M., Martinez-Reyes H.L., et al. | 2012 | Procedia Engineering | Scopus-id: 2-s2.0-84874528426
| 0 | 46 |