EDUARDO ANTONIO MURILLO BRACAMONTES



DATOS GENERALES
Nombre completo   EDUARDO ANTONIO MURILLO BRACAMONTES
Máximo nivel de estudios   DOCTORADO
Antigüedad académica en la UNAM   11 años
NOMBRAMIENTOS
Vigente   TECNICO ACADEMICO TITULAR C TC Definitivo
Centro de Nanociencias y Nanotecnología en la UNAM
Desde 01-10-2022
TECNICO ACADEMICO TITULAR B TC Definitivo
Centro de Nanociencias y Nanotecnología en la UNAM
Desde 16-04-2019 hasta 30-09-2022
TECNICO ACADEMICO TITULAR A TC Definitivo
Centro de Nanociencias y Nanotecnología en la UNAM
Desde 16-11-2018 hasta 15-04-2019
TECNICO ACADEMICO TITULAR A TC No Definitivo
Centro de Nanociencias y Nanotecnología en la UNAM
Desde 01-04-2014 hasta 15-11-2018
ESTIMULOS, PROGRAMAS, PREMIOS Y RECONOCIMIENTOS
* SNI I2019 - VIGENTE
* SNI C2016 - 2018
* PRIDE C2019 - 2024
* EQUIVALENCIA PRIDE B2014 - 2019

INFORMACIÓN DE PUBLICACIONES
Firmas  
Murillo E. Murillo, E. Murillo, Eduardo Murillo-Bracamontes E.A. Murillo-Bracamontes, E. Murillo-Bracamontes, E. A.
Murillo-Bracamontes, EA Murillo-Bracamontes, Eduardo A. Murillo-Bracamontes, Edurado A.
ID's SCOPUS  
57194380302
Áreas de conocimiento  
Energy and fuels Engineering, electrical and electronic Engineering, multidisciplinary Materials science, coatings and films Materials science, multidisciplinary
Multidisciplinary sciences Physics, applied Physics, condensed matter Computer science (miscellaneous) Condensed Matter Physics
Chemical engineering (miscellaneous) Chemistry (miscellaneous) Electrical and electronic engineering Engineering (miscellaneous) Mechanical engineering
Multidisciplinary Physics and astronomy (miscellaneous) Surfaces, coatings and films
Coautorías con entidades de la UNAM  
  • Centro de Nanociencias y Nanotecnología en la UNAM
  • Centro de Investigaciones en Geografía Ambiental en Morelia, Michoacán
  • Facultad de Estudios Superiores "Iztacala"
  • Escuela Nacional de Estudios Superiores, Unidad Morelia, Michoacán
Revistas en las que ha publicado  (17):
  1. Advanced Energy And Sustainability Research, Estados Unidos America (2025)
  2. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, Estados Unidos America (2018)
  3. APPLIED SURFACE SCIENCE, Países Bajos (2018, 2023)
  4. IEEE Antennas and Propagation Society International Symposium, Estados Unidos America (2019)
  5. IET SCIENCE MEASUREMENT & TECHNOLOGY, Reino Unido (2021)
  6. JOURNAL OF APPLIED PHYSICS, Estados Unidos America (2020)
  7. Journal of Energy Storage, Países Bajos (2020)
  8. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, Países Bajos (2018)
  9. JOURNAL OF PHYSICAL CHEMISTRY C, Estados Unidos America (2021)
  10. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, Reino Unido (2017)
  11. Measurement, Reino Unido (2017)
  12. NANOMATERIALS, Suiza (2024)
  13. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, Alemania (2018)
  14. Procedia Engineering, Países Bajos (2012)
  15. SCIENTIFIC REPORTS, Reino Unido (2021)
  16. SUPERLATTICES AND MICROSTRUCTURES, Estados Unidos America (2016)
  17. Symmetry-Basel, Suiza (2020)


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Documentos indexados (WoS y Scopus)

# Título del documento Autores Año Revista Fuente Citas WoS Citas Scopus
1From Graphene Oxide to N-Doped Graphene: Understanding the Doping ProcessCoautor: Murillo-Bracamontes, EA, Ruiz-Marizcal, JM, Paez-Ornelas, JI, Fernández-Escamilla, HN, et al.2025Advanced Energy And Sustainability ResearchWoS-id: 001389889300001
Scopus-id: 2-s2.0-105001724689
00
2Magnetic-Dielectric Cantilevers for Atomic Force MicroscopyCoautor: Murillo-Bracamontes, EA, Sanchez-Seguame, G, Avalos-Sanchez, H, Lugo, JE, et al.2024NANOMATERIALSWoS-id: 001231470800001
Scopus-id: 2-s2.0-85194228348
11
3Enabling high-quality transparent conductive oxide on 3D printed ZrO2 architectures through atomic layer depositionCoautor: Murillo-Bracamontes, Edurado A., Arriaga Dávila J., Winczewski, Jedrzej P., Herrera-Zaldivar, Manuel, et al.2023APPLIED SURFACE SCIENCEWoS-id: 001037048800001
Scopus-id: 2-s2.0-85163875368
1213
4Contact resonance frequencies and their harmonics in scanning probe microscopy1ᵉʳ autor: Murillo-Bracamontes, Eduardo A., Gervacio-Arciniega, Juan J., Cruz-Valeriano, Edgar, Enriquez-Flores, I, Christian, et al.2021IET SCIENCE MEASUREMENT & TECHNOLOGYWoS-id: 000619536700001
Scopus-id: 2-s2.0-85101451186
33
5Understanding the Role of Oxygen Vacancies in the Stability of ZnO(0001)-(1 x 3) Surface ReconstructionsCoautor: Murillo-Bracamontes, E., Paez-Ornelas, I, J., Ponce-Perez, R., Fernandez-Escamilla, H. N., et al.2021JOURNAL OF PHYSICAL CHEMISTRY CWoS-id: 000641307100045
Scopus-id: 2-s2.0-85104914404
1210
6The effect of shape and size in the stability of triangular Janus MoSSe quantum dotsCoautor: Murillo-Bracamontes, E. A., Paez-Ornelas, I, J., Ponce-Perez, R., Fernandez-Escamilla, H. N., et al.2021SCIENTIFIC REPORTSWoS-id: 000711622600068
Scopus-id: 2-s2.0-85118342169
78
7YSZ thin film nanostructured battery for on-chip energy storage applicationsCoautor: Murillo E., Lizarraga E., Read J., Solorio F., et al.2020Journal of Energy StorageWoS-id: 000530627500010
Scopus-id: 2-s2.0-85078142680
1212
8Design of Concentric Ring Antenna Arrays Based on Subarrays to Simplify the Feeding SystemCoautor: Murillo, Eduardo, Juarez, Elizvan, Panduro, Marco A., Reyna, Alberto, et al.2020Symmetry-BaselWoS-id: 000550791300001
Scopus-id: 2-s2.0-85089196791
1011
9Piezoresponse force microscopy imaging and its correlation with cantilever spring constant and frequency2ᵒ autor: Murillo-Bracamontes, E. A., Solis Canto, O., Gervacio-Arciniega, J. J., Toledo-Solano, M., et al.2020JOURNAL OF APPLIED PHYSICSWoS-id: 000565316500001
Scopus-id: 2-s2.0-85090089298
12
10Erratum: Piezoresponse force microscopy imaging and its correlation with cantilever spring constant and frequency (Journal of Applied Physics (2020) 128 (084101) DOI: 10.1063/5.0013287)2ᵒ autor: Murillo-Bracamontes, E. A., Solis Canto, O., Gervacio-Arciniega, J. J., Toledo-Solano, M., et al.2020JOURNAL OF APPLIED PHYSICSWoS-id: 000585808400002
Scopus-id: 2-s2.0-85094681018
00
11Discrimination of a ferroelectric from a non-ferroelectric response in PFM by phase analyses at the harmonics of the applied Vac2ᵒ autor: Murillo-Bracamontes, E. A., Gervacio-Arciniega, J. J., Toledo-Solano, M., Fuentes, J., et al.2020JOURNAL OF APPLIED PHYSICSWoS-id: 000619258500001
20
12Reducing the Number of Phase Shifters in Circular Arrays of Circular Subarrays for a Wide-Scanning PatternCoautor: Murillo, Eduardo, Juarez, Elizvan, Panduro, Marco A., Reyna, Alberto, et al.2019IEEE Antennas and Propagation Society International SymposiumWoS-id: 000657207103072
10
13Multiferroic YCrO 3 thin films: Structural, ferroelectric and magnetic properties2ᵒ autor: Murillo-Bracamontes, E., Gervacio-Arciniega, J. J., Contreras, O., Siqueiros, J. M., et al.2018APPLIED SURFACE SCIENCEWoS-id: 000415219100081
Scopus-id: 2-s2.0-85029395263
67
14Dielectric constant measurement using atomic force microscopy of dielectric films: a system theory approachCoautor: Murillo-Bracamontes, E. A., Cruz-Valeriano, E., Guzman-Caballero, D. E., Escamilla-Diaz, T., et al.2018APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSINGWoS-id: 000443942300002
Scopus-id: 2-s2.0-85053016286
45
15Physical and electrical characterization of yttrium-stabilized zirconia (YSZ) thin films deposited by sputtering and atomic-layer depositionCoautor: Murillo, Eduardo, Molina-Reyes, Joel, Tiznado, Hugo, Soto, Gerardo, et al.2018JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICSWoS-id: 000444200300011
Scopus-id: 2-s2.0-85044057918
1920
16Poole-Frenkel Conduction Mechanism in ZnO:N Nanobelts2ᵒ autor: Murillo, Eduardo, Carrera-Gutierrez, Karime, Rivero, Ignacio, Herrera-Zaldivar, Manuel2018PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCEWoS-id: 000446839100013
Scopus-id: 2-s2.0-85054861467
44
17An alternative scheme to measure single-point hysteresis loops using piezoresponse force microscopyCoautor: Murillo-Bracamontes, E., Flores-Ruiz, F. J., Gervacio-Arciniega, J. J., Cruz, M. P., et al.2017MeasurementWoS-id: 000404201400015
Scopus-id: 2-s2.0-85019846244
87
18Structural and electrical characterization of multilayer Al2O3/ZnO nanolaminates grown by atomic layer depositionCoautor: Murillo, E., Martinez-Castelo, J. R., Lopez, J., Dominguez, D., et al.2017MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSINGWoS-id: 000412963700043
Scopus-id: 2-s2.0-85027567036
1717
19Thickness effect on the optical and morphological properties in Al2O3/ZnO nanolaminate thin films prepared by atomic layer depositionCoautor: Murillo, E., Lopez, J., Martinez, J., Abundiz, N., et al.2016SUPERLATTICES AND MICROSTRUCTURESWoS-id: 000370312800031
Scopus-id: 2-s2.0-84952765304
2225
20Implementation of Hough Transform for fruit image segmentation1ᵉʳ autor: Murillo-Bracamontes E.A., Martinez-Rosas M.E., Miranda-Velasco M.M., Martinez-Reyes H.L., et al.2012Procedia EngineeringScopus-id: 2-s2.0-84874528426
046
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