ROBERTO MACHORRO MEJIA



DATOS GENERALES
Nombre completo   ROBERTO MACHORRO MEJIA
Máximo nivel de estudios   DOCTORADO
Antigüedad académica en la UNAM   38 años
NOMBRAMIENTOS
Vigente   INVESTIGADOR TITULAR C TC Definitivo
Centro de Nanociencias y Nanotecnología en la UNAM
Desde 16-09-2024
INVESTIGADOR TITULAR B TC Definitivo
Centro de Nanociencias y Nanotecnología en la UNAM
Desde 01-01-2008 (fecha inicial de registros en el SIIA) hasta 15-09-2024
ESTIMULOS, PROGRAMAS, PREMIOS Y RECONOCIMIENTOS
* SNI III2011 - 2024
* SNI II - 2009
* PRIDE C - 2024

INFORMACIÓN DE PUBLICACIONES
Firmas  
MacHorro R. Machorro M. R. Machorro Mejia, Roberto Machorro R. Machorro, R Machorro, R.
Machorro, Roberto Machorro-Mejia R. Machorro-Mejía, R Machorro-Mejia, R. Machorro-Mejia, Roberto
ID's SCOPUS  
55513609600 56756494100 7004001030 55993665700
Áreas de conocimiento  
Chemistry, physical Engineering, civil Engineering, chemical Engineering, electrical & electronic History and philosophy of science
Instruments & instrumentation Materials science Materials science, coatings & films Materials science, coatings and films Materials science, multidisciplinary
Metallurgy and metallurgical engineering Optics Physics Physics, applied Physics, condensed matter
Physics, interdisciplinary Physics, multidisciplinary Acoustics and ultrasonics Atomic and Molecular Physics, and Optics Biotechnology
Building and construction Computer science (miscellaneous) Condensed Matter Physics Chemical Engineering (miscellaneous) Electrical and Electronic Engineering
Electronic, optical and magnetic materials Industrial and Manufacturing Engineering Materials chemistry Materials Science (miscellaneous) Mechanical engineering
Metals and alloys Physics and Astronomy (miscellaneous) Surfaces, coatings and films
Coautorías con entidades de la UNAM  
  • Centro de Nanociencias y Nanotecnología en la UNAM
  • Centro de Física Aplicada y Tecnología Avanzada
  • Instituto de Física
  • Instituto de Investigaciones en Materiales
Revistas en las que ha publicado  (41):
  1. ACTA MATERIALIA, Estados Unidos America (2014)
  2. APPLIED OPTICS, Estados Unidos America (1988, 1995)
  3. APPLIED SURFACE SCIENCE, Países Bajos (1998, 1999, 2001, 2003, 2008, 2014)
  4. CATALYSIS TODAY, Países Bajos (2005)
  5. COLLOID AND INTERFACE SCIENCE COMMUNICATIONS, Países Bajos (2016)
  6. DIAMOND AND RELATED MATERIALS, Suiza (2003, 2006)
  7. ENERGY AND BUILDINGS, Suiza (2020)
  8. Ferroelectrics, Reino Unido (1999)
  9. INTERNATIONAL JOURNAL OF MODERN PHYSICS B, Singapur (2009)
  10. J VAC SCI TECHNOL B, Estados Unidos America (1997)
  11. JOURNAL OF ALLOYS AND COMPOUNDS, Suiza (2017)
  12. JOURNAL OF APPLIED PHYSICS, Estados Unidos America (1998, 2001, 2013)
  13. JOURNAL OF COLLOID AND INTERFACE SCIENCE, Estados Unidos America (2012)
  14. JOURNAL OF LASER MICRO NANOENGINEERING, Japón (2016)
  15. JOURNAL OF PHYSICS D-APPLIED PHYSICS, Reino Unido (2018, 2019, 2021, 2024)
  16. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, Estados Unidos America (1997)
  17. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Estados Unidos America (1998, 2005, 2024)
  18. MATERIALS LETTERS, Países Bajos (2000, 2002, 2021)
  19. MATERIALS RESEARCH BULLETIN, Estados Unidos America (2017)
  20. Materials Research Society Symposium Proceedings, Estados Unidos America (1997, 1998, 2012)
  21. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, Reino Unido (2017)
  22. MICROELECTRON J, Reino Unido (2008)
  23. MOMENTO-REVISTA DE FISICA, Colombia (2020)
  24. OPTICAL MATERIALS, Países Bajos (2017, 2019)
  25. OPTICS AND LASER TECHNOLOGY, Reino Unido (2020)
  26. OPTICS COMMUNICATIONS, Países Bajos (1995)
  27. Optics InfoBase Conference Papers, Estados Unidos America (2007)
  28. OPTICS, PHOTONICS, AND DIGITAL TECHNOLOGIES FOR IMAGING APPLICATIONS VIII, Estados Unidos America (1986, 1987, 1988, 1996, 2004, 2011, 2014, 2016)
  29. Optik, Alemania (1998)
  30. PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION, Alemania (2023)
  31. PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, Países Bajos (2013)
  32. PHYSICS TEACHER, Estados Unidos America (2008)
  33. Plasmonics, Estados Unidos America (2013)
  34. POWDER TECHNOLOGY, Países Bajos (2014)
  35. REVIEW OF SCIENTIFIC INSTRUMENTS, Estados Unidos America (2004)
  36. REVISTA MEXICANA DE FISICA, México (1997, 1998, 2005, 2006, 2009, 2012)
  37. SOLID STATE COMMUNICATIONS, Estados Unidos America (1997)
  38. Solid State Phenomena, Suiza (2010)
  39. SUPERLATTICES AND MICROSTRUCTURES, Estados Unidos America (2016)
  40. SURFACE ENGINEERING, Reino Unido (1999)
  41. Thin Solid Films, Suiza (1985, 1995, 2003, 2018, 2022)


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Documentos indexados (WoS y Scopus)

# Título del documento Autores Año Revista Fuente Citas WoS Citas Scopus
1Plasma emission spectroscopy and optical properties of reactive-sputtered silicon oxynitride filmsCoautor: Machorro-Mejía, R, Rodríguez-López, R, Abundiz-Cisneros, N, Sanginés, R, et al.2024JOURNAL OF PHYSICS D-APPLIED PHYSICSWoS-id: 001204904600001
Scopus-id: 2-s2.0-85190827848
23
2Analysis of pulsed direct current reactive magnetron sputtering on a silicon targetCoautor: Machorro-Mejia, R, Teran-Hinojosa, E, Sanginés, R, Abundiz-Cisneros, N, et al.2024JOURNAL OF VACUUM SCIENCE & TECHNOLOGY AWoS-id: 001321277100004
Scopus-id: 2-s2.0-85205923433
00
3Carbon Quantum Dot Optical Properties for potential infiltration into Hollow Core Photonic Crystal FibersCoautor: Machorro, Roberto, Arroyo, Eurydice, Tentori, Diana, Garcia, Alfonso, et al.2023PARTICLE & PARTICLE SYSTEMS CHARACTERIZATIONWoS-id: 000973374200001
Scopus-id: 2-s2.0-85152906041
11
4Study of deposition parameters of reactive-sputtered Si3N4 thin films by optical emission spectroscopyCoautor: Machorro-Mejía R., Rodríguez-López R., Soto-Valle G., Sanginés R., et al.2022Thin Solid FilmsWoS-id: 000814390000003
Scopus-id: 2-s2.0-85130830520
55
5Plasma optical emission spectroscopy as a tool to monitor TiNx deposition via reactive magnetron sputteringCoautor: Machorro-Mejía R., Sierra-Cruz I., Sanginés R., Cruz J.2021MATERIALS LETTERSWoS-id: 000612302900005
Scopus-id: 2-s2.0-85096819753
11
6Si sputtering yield amplification: a study of the collisions cascade and species in the sputtering plasmaCoautor: Machorro-Mejia, R., Cruz, J., Sangines, R., Soto-Valle, G., et al.2021JOURNAL OF PHYSICS D-APPLIED PHYSICSWoS-id: 000668708800001
Scopus-id: 2-s2.0-85110325918
11
7Novel Low-E filter for architectural glass paneCoautor: Machorro, R., Abundiz-Cisneros, N., Sangines, R., Rodriguez-Lopez, R., et al.2020ENERGY AND BUILDINGSWoS-id: 000505647500006
Scopus-id: 2-s2.0-85074633746
3341
8Non-quarter-wave dielectric mirror prepared by thermal atomic layer depositionCoautor: Machorro R., Lopez J., Márquez H., Borbón - Nuñez H., et al.2020OPTICS AND LASER TECHNOLOGYWoS-id: 000523646800036
Scopus-id: 2-s2.0-85080037566
12
9Efecto de la temperatura del sustrato en la rugosidad e índice de refracción en el visible e infrarrojo cercano de películas delgadas de nitruro de tantalioCoautor: Machorro-Mejía R., Torres-Muro H.A., Talledo-Coronado A., Ordoñez-Miranda J., et al.2020MOMENTO-REVISTA DE FISICAWoS-id: 000547478600004
Scopus-id: 2-s2.0-85092584857
00
10Electrical properties and spectroscopic ellipsometry studies of covellite CuS thin films deposited from non ammoniacal chemical bathCoautor: Machorro-Mejia, R., Diliegros-Godines, C. J., Lombardero-Juarez, I, D., González R.S., et al.2019OPTICAL MATERIALSWoS-id: 000470938800022
Scopus-id: 2-s2.0-85063346438
2021
11Modeling the thickness distribution of silicon oxide thin films grown by reactive magnetron sputteringCoautor: Machorro-Mejia, R., Cruz, J., Sangines, R., Abundiz-Cisneros, N., et al.2019JOURNAL OF PHYSICS D-APPLIED PHYSICSWoS-id: 000487724700001
Scopus-id: 2-s2.0-85073245538
33
12Cleaning level of the target before deposition by reactive direct current magnetron sputteringCoautor: Machorro R., Hernandez Utrera O., Abundiz-Cisneros N., Sanginés R., et al.2018Thin Solid FilmsWoS-id: 000418575900014
Scopus-id: 2-s2.0-85035811153
1114
13Plasma emission spectroscopy and its relation to the refractive index of silicon nitride thin films deposited by reactive magnetron sputteringCoautor: Machorro-Mejia R., Sanginés R., Abundiz-Cisneros N., Hernández Utrera O., et al.2018JOURNAL OF PHYSICS D-APPLIED PHYSICSWoS-id: 000424898300001
Scopus-id: 2-s2.0-85042348979
1315
14Refractive index and bandgap variation in Al2O3-ZnO ultrathin multilayers prepared by atomic layer depositionCoautor: Machorro, R., Lopez, J., Solorio, E., Borbon-Nunez, H. A., et al.2017JOURNAL OF ALLOYS AND COMPOUNDSWoS-id: 000386227900039
Scopus-id: 2-s2.0-84984806948
3738
15Influence of the bilayer thickness on the optical properties of Al2O3-Y2O3 dielectric nanolaminate films grown by thermal atomic layer depositionCoautor: Machorro, R., Lopez, J., Sotelo, A., Castillon, F. F., et al.2017MATERIALS RESEARCH BULLETINWoS-id: 000392681800003
Scopus-id: 2-s2.0-84996562146
77
16Structural and electrical characterization of multilayer Al2O3/ZnO nanolaminates grown by atomic layer depositionCoautor: Machorro, R., Martinez-Castelo, J. R., Lopez, J., Dominguez, D., et al.2017MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSINGWoS-id: 000412963700043
Scopus-id: 2-s2.0-85027567036
1717
17Al2O3-Y2O3 ultrathin multilayer stacks grown by atomic layer deposition as perspective for optical waveguides applicationsCoautor: Machorro R., López J., Borbón-Nuñez H.A., Lizarraga-Medina E.G., et al.2017OPTICAL MATERIALSWoS-id: 000413880500119
Scopus-id: 2-s2.0-85025084865
1212
18Thickness effect on the optical and morphological properties in Al2O3/ZnO nanolaminate thin films prepared by atomic layer depositionCoautor: Machorro, R., Lopez, J., Martinez, J., Abundiz, N., et al.2016SUPERLATTICES AND MICROSTRUCTURESWoS-id: 000370312800031
Scopus-id: 2-s2.0-84952765304
2225
19Silver Nanoparticles by Laser Ablation Confined in Alcohol Using an Argon Gas EnvironmentCoautor: Machorro Mejia, Roberto, Oseguera Galindo, David Omar, Hernandez Utrera, Oscar, Santana Aranda, Miguel Angel2016JOURNAL OF LASER MICRO NANOENGINEERINGWoS-id: 000386652200004
Scopus-id: 2-s2.0-84994551690
54
20Plasmon spectra of binary Ag-Cu mixtures supported in mordeniteCoautor: Machorro, Roberto, Lopez-Bastidas, Catalina, Smolentseva, Elena, Petranovskii, Vitalii P.2016OPTICS, PHOTONICS, AND DIGITAL TECHNOLOGIES FOR IMAGING APPLICATIONS VIIIWoS-id: 000390259100025
Scopus-id: 2-s2.0-85008500773
22
21Silver nanoparticles synthesized by laser ablation confined in urea choline chloride deep-eutectic solvent2ᵒ autor: Machorro-Mejia, Roberto, Oseguera-Galindo, David O., Bogdanchikova, Nina, Mota-Morales, Josue D.2016COLLOID AND INTERFACE SCIENCE COMMUNICATIONSWoS-id: 000394659500001
Scopus-id: 2-s2.0-84968755056
2835
22Multiferroic properties and magnetoelectric coupling in highly textured Pb(Fe0.5Nb0.5)O3 thin films obtained by RF sputteringCoautor: Machorro R., Raymond O., Ostos C., Font R., et al.2014ACTA MATERIALIAWoS-id: 000331422600018
Scopus-id: 2-s2.0-84891768040
1820
23Optical spectra of noble metal nanoparticles supported on zeolitesCoautor: Machorro R., Bastidas C.L., Smolentseva E., Petranovskii V.2014OPTICS, PHOTONICS, AND DIGITAL TECHNOLOGIES FOR IMAGING APPLICATIONS VIIIWoS-id: 000345022700031
Scopus-id: 2-s2.0-84922901056
00
24Plasmon resonance of gold nanoparticles supported on Y-zeolite in the presence of various co-cationsCoautor: Machorro R., Smolentseva E., López-Bastidas C., Petranovskii V.2014APPLIED SURFACE SCIENCEWoS-id: 000345507900020
Scopus-id: 2-s2.0-84912142692
77
25Pulsed-bed atomic layer deposition setup for powder coatingCoautor: Machorro, R, Tiznado, H, Dominguez, D, Munoz-Munoz, F, et al.2014POWDER TECHNOLOGYWoS-id: 000353184900023
Scopus-id: 2-s2.0-84907333605
2527
26Optical spectroscopy and spectroscopic ellipsometry as a monitor for thin film growth by dc magnetron sputteringCoautor: Machorro R., Abundiz-Cisneros N., Perez-Garcia A., Gomez-Muñoz M.2013JOURNAL OF APPLIED PHYSICSWoS-id: 000317238000010
Scopus-id: 2-s2.0-84880676050
11
27TEM and spectroscopic ellipsometry studies of multilayer gate dielectrics containing crystalline and amorphous Si nanoclustersCoautor: Machorro R., Mateos D., Curiel M.A., Nedev N., et al.2013PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURESWoS-id: 000320145400020
Scopus-id: 2-s2.0-84892555566
44
28Plasmon Features of Coinage Metal Nanoparticles Supported on ZeolitesCoautor: Machorro, R, Lopez-Bastidas, C, Smolentseva, E, Petranovskii, V2013PlasmonicsWoS-id: 000328327100006
Scopus-id: 2-s2.0-84887615380
1011
29Optical response of Cu clusters in zeolite templateCoautor y autor de correspondencia: Machorro, R, Lopez-Bastidas, C, Petranovskii, V2012JOURNAL OF COLLOID AND INTERFACE SCIENCEWoS-id: 000302760900008
Scopus-id: 2-s2.0-84858998905
810
30TiO2 and Al2O3 ultra thin nanolaminates growth by ALD; instrument automation and films characterizationCoautor: Machorro R., Tiznado H., Do?inguez D., de la Cruz W., et al.2012REVISTA MEXICANA DE FISICAScopus-id: 2-s2.0-84867471767
017
31Ferroelectricity, ferromagnetism, and magnetoelectric coupling in highly textured thin films of the multiferroic Pb(Fe0.5Nb 0.5)O3Coautor: Machorro-Mejia R., Raymond-Herrera O., Góngora-Lugo P., Ostos C., et al.2012Materials Research Society Symposium ProceedingsScopus-id: 2-s2.0-84870663417
02
32Optical spectroscopy as a monitor of thin film growth in sputteringCoautor: MacHorro R., Abundiz N., Perez A., García V.2011OPTICS, PHOTONICS, AND DIGITAL TECHNOLOGIES FOR IMAGING APPLICATIONS VIIIWoS-id: 000297585800095
Scopus-id: 2-s2.0-84858437037
00
33Influence of thermal annealing on the properties of sputtered Si rich silicon oxide filmsCoautor: Machorro R., Manolov E., Curiel M., Nedev N., et al.2010Solid State PhenomenaWoS-id: 000280419000015
Scopus-id: 2-s2.0-77951020252
00
34Characterization of aln thin films fabricated by reactive dc sputtering: Experimental measurements and hückel calculationsCoautor: MacHorro R., GarcÍa-MÉndez M., Morales-RodrÍguez S., GalvÁn D.H.2009INTERNATIONAL JOURNAL OF MODERN PHYSICS BWoS-id: 000265543600007
Scopus-id: 2-s2.0-67249090397
88
35Model of the discharge voltage of the deposit ZrOX by reactive ion erosionCoautor: Machorro-Mejia, R, Garcia-Gradilla, V, Soto-Herrera, G, Mitrani-Abenchuchan, E2009REVISTA MEXICANA DE FISICAWoS-id: 000265620100005
00
36Correlation between optical characterization of the plasma in reactive magnetron sputtering deposition of Zr-N on SS 316L and surface and mechanical properties of the deposited2ᵒ autor: Machorro R., Fragiel A., Munoz-Saldana, J, Salinas J., et al.2008APPLIED SURFACE SCIENCEWoS-id: 000255511700034
Scopus-id: 2-s2.0-42749089228
23
37Optical properties of Zr and ZrO(2) films deposited by laser ablationCoautor: Machorro R., Prieto-López L.O., Yubero F., De La Cruz W.2008MICROELECTRON JWoS-id: 000261295900063
Scopus-id: 2-s2.0-54849434865
1111
38How does it sound? Young interferometry using sound waves1ᵉʳ autor: Machorro R., Samano E.C.2008PHYSICS TEACHERScopus-id: 2-s2.0-85006285090
03
39Stoichiometry monitor in plasma assisted deposition using optical spectroscopyCoautor: Machorro R., Raymond O., Salinas J., Camacho J., et al.2007Optics InfoBase Conference PapersScopus-id: 2-s2.0-84898814659
01
40Surface and optical analysis of SiCx films prepared by RF-RMS techniqueCoautor: MacHorro R., Mahmood A., Muhl S., Lousa A., et al.2006DIAMOND AND RELATED MATERIALSWoS-id: 000234605900013
Scopus-id: 2-s2.0-29244475753
1210
41Multi-wavelength images detector for micro-cathodoluminescence analysisCoautor: Machorro R., Pérez-Tijerina E., Gradilla I., Garcia V., et al.2006REVISTA MEXICANA DE FISICAScopus-id: 2-s2.0-33749670272
01
42Optimal control on composition and optical properties of silicon oxynitride thin filmsCoautor y autor de correspondencia: MacHorro R., Samano E.C., Camacho J.2005JOURNAL OF VACUUM SCIENCE & TECHNOLOGY AWoS-id: 000230717200119
Scopus-id: 2-s2.0-31144458858
1010
43Spectroscopic observation and ab initio simulation of copper clusters in zeolitesCoautor y autor de correspondencia: Machorro R., Petranovskii V., Gurin V.2005CATALYSIS TODAYWoS-id: 000233293600123
Scopus-id: 2-s2.0-26844551771
1817
44Density and temperature maps of an aluminium plasma produced by laser ablationCoautor y autor de correspondencia: Machorro R., Pérez-Tijerina E., Bohigas J.2005REVISTA MEXICANA DE FISICAScopus-id: 2-s2.0-19744365172
06
45Wide-field spectroscopy for optical characterization of the pulsed laser deposition plume2ᵒ autor: Machorro R., Pérez-Tijerina E., Bohigas J.2004REVIEW OF SCIENTIFIC INSTRUMENTSWoS-id: 000188532400025
Scopus-id: 2-s2.0-1542782950
44
46Optical appearance of copper clusters and nanoparticles in zeolitesCoautor: Machorro R., Petranovskii V., Gurin V., Abbaspur A.2004OPTICS, PHOTONICS, AND DIGITAL TECHNOLOGIES FOR IMAGING APPLICATIONS VIIIWoS-id: 000224152900027
Scopus-id: 2-s2.0-10844231009
12
47Growth of beryllium nitride films by pulsed laser deposition; dielectric function determination2ᵒ autor: Machorro R., Soto G., Díaz J.A., De la Cruz W., et al.2003Thin Solid FilmsWoS-id: 000183700000002
Scopus-id: 2-s2.0-0038615928
88
48Tungsten nitride films grown via pulsed laser deposition studied in situ by electron spectroscopiesCoautor: Machorro R., Soto G., de la Cruz W., Castillón F.F., et al.2003APPLIED SURFACE SCIENCEWoS-id: 000183731800008
Scopus-id: 2-s2.0-0038519222
4445
49Optical and surface analysis of DC-reactive sputtered AlN films2ᵒ autor: Machorro R., Mahmood A., Muhl S., Heiras J., et al.2003DIAMOND AND RELATED MATERIALSWoS-id: 000184315100007
Scopus-id: 2-s2.0-0041621825
7680
50Characterization of tungsten oxide films produced by reactive pulsed laser depositionCoautor: Machorro R., Soto G., De La Cruz W., Díaz J.A., et al.2003APPLIED SURFACE SCIENCEWoS-id: 000185491500036
Scopus-id: 2-s2.0-0042193577
3020
51Beryllium nitride thin film grown by reactive laser ablationCoautor: Machorro R., Soto G., Díaz J.A., Reyes-Serrato A., et al.2002MATERIALS LETTERSWoS-id: 000173168200007
Scopus-id: 2-s2.0-0036131717
4849
52Density and temperature sensitive line ratios in plasmas generated by laser ablationCoautor y autor de correspondencia: Machorro R., Pérez-Tijerina E., Bohigas J.2001JOURNAL OF APPLIED PHYSICSWoS-id: 000171135900008
Scopus-id: 2-s2.0-0035477870
813
53Study of composition and bonding character of CNx filmsCoautor: Machorro R., Soto G., Samano E.C., Farías M.H., et al.2001APPLIED SURFACE SCIENCEWoS-id: 000172506500010
Scopus-id: 2-s2.0-0035965655
3436
54Modification of refractive index in silicon oxynitride films during deposition1ᵉʳ autor: MacHorro R., Samano E.C., Soto G., Villa F., et al.2000MATERIALS LETTERSWoS-id: 000088275100011
Scopus-id: 2-s2.0-0033691420
3235
55Piezoelectricity and aging effects in the PMN-PT systemCoautor: Machorro R., Portelles J., Siqueiros J.M., Fundora A., et al.1999FerroelectricsScopus-id: 2-s2.0-0033086510
01
56Electropolishing of Zinalco and characterization of resulting surfaceCoautor y autor de correspondencia: Machorro R., Guerrero R., Cota L.1999SURFACE ENGINEERINGScopus-id: 2-s2.0-0033311459
03
57Stability of silver clusters in mordenites with different SiO2/Al2O3 molar ratioCoautor: Machorro M. R., Bogdanchikova N.E., P. Petranovskii V., Sugi Y., et al.1999APPLIED SURFACE SCIENCEScopus-id: 2-s2.0-0033356682
4356
58Characterization of Pt thin films deposited by DC sputtering at different temperatures on Ti/glass and TiO2/Si substratesCoautor: Machorro R., Cruz Ma.D.L.P., Siqueiros J.M., Valenzuela J., et al.1999FerroelectricsScopus-id: 2-s2.0-6244303725
08
59Growth of SiC and SiCxNy films by pulsed laser ablation of SiC in Ar and N2 environmentsCoautor: Machorro R., Soto G., Samano E.C., Cota L.1998JOURNAL OF VACUUM SCIENCE & TECHNOLOGY AWoS-id: 000074150400078
Scopus-id: 2-s2.0-0001597593
5054
60In situ ellipsometric characterization of SiNx films grown by laser ablation2ᵒ autor: Machorro R., Samano E.C., Soto G., Cota-Araiza L.1998JOURNAL OF APPLIED PHYSICSScopus-id: 2-s2.0-0000131264
024
61Interference in far-field radiation of two contra-propagating surface plasmon polaritons in the kretchmann configuration2ᵒ autor: Machorro R., Xiao M., Siqueiros J.1998JOURNAL OF VACUUM SCIENCE & TECHNOLOGY AScopus-id: 2-s2.0-0000583923
99
62Effects of background gas-plume interaction in the deposition of SiNx films2ᵒ autor: Machorro R., Samano E.C., Soto G., Cota-Araiza L.1998APPLIED SURFACE SCIENCEScopus-id: 2-s2.0-0032075456
015
63SiCxNy, thin films alloys prepared by pulsed excimer laser deposition1ᵉʳ autor: Machorro R., Samano E.C., Soto G., Cota L.1998APPLIED SURFACE SCIENCEScopus-id: 2-s2.0-0032075556
048
64Subwavelength resolution in far field microscopy without near field probe2ᵒ autor y autor de correspondencia: Machorro R., Xiao M.1998OptikScopus-id: 2-s2.0-0032291092
01
65Refractive index modification during deposition of silicon oxynitride films prepared by reactive laser ablation1ᵉʳ autor: Machorro R., Soto G., Samano E.C., Cota-Araiza L.1998Materials Research Society Symposium ProceedingsScopus-id: 2-s2.0-0032319356
01
66Obtention of a non stoichiometric PMN-PT ferroelectric systemCoautor: Machorro R., Fundora A., Portelles J., Pentón A., et al.1998REVISTA MEXICANA DE FISICAScopus-id: 2-s2.0-0032375063
01
67Characterization of excess Si in nonstoichiometric SiO2 films by optical and surface analysis techniquesCoautor: Machorro R., Falcony C., Calleja W., Aceves M., et al.1997JOURNAL OF THE ELECTROCHEMICAL SOCIETYWoS-id: A1997WG07000063
Scopus-id: 2-s2.0-0030786844
1517
68Dielectric properties of the La3+ doped Sr0.3-3y/2LayBa0.7Nb2O6 ceramic systemCoautor: Machorro R., Guerrero F., Portelles J.J., González I., et al.1997SOLID STATE COMMUNICATIONSScopus-id: 2-s2.0-0031079198
022
69Ellipsometric study of the Cu/V/mica system2ᵒ autor: Machorro R., Siqueiros J.M., Wang S.1997REVISTA MEXICANA DE FISICAScopus-id: 2-s2.0-0031320894
03
70Microstructural identification of SiNx films by real-time ellipsometryCoautor: Machorro R., Soto G., Samano E.C., Avalos M., et al.1997Materials Research Society Symposium ProceedingsScopus-id: 2-s2.0-0031338336
00
71Fabrication of probe tips for reflection scanning near-field optical microscopes: Chemical etching and heating-pulling methodsCoautor: Machorro R., Xiao M., Nieto J., Siqueiros J., et al.1997J VAC SCI TECHNOL BWoS-id: A1997XT08800140
Scopus-id: 2-s2.0-0347014661
1314
72Surface plasmons on nonlocal corrugated interfaceCoautor y autor de correspondencia: Machorro R., Wang S., Siquoiros J.1996OPTICS, PHOTONICS, AND DIGITAL TECHNOLOGIES FOR IMAGING APPLICATIONS VIIIScopus-id: 2-s2.0-84887333118
00
73Rugate absorbing thin films and the 2 × 2 inhomogeneous matrix2ᵒ autor: Machorro R., Villa F., Martínez A.1995APPLIED OPTICSWoS-id: A1995RE61500021
Scopus-id: 2-s2.0-10844279423
33
74Optical properties of Mg, from UV to IR, using ellipsometry and reflectometry1ᵉʳ autor: Machorro R., Siqueiros J.M., Wang S.1995Thin Solid FilmsWoS-id: A1995TM38900001
Scopus-id: 2-s2.0-0029404560
1919
75Nonlocal effects on the optical response of a rough surfaceCoautor y autor de correspondencia: Machorro R., Wang S., Siqueiros J.1995OPTICS COMMUNICATIONSWoS-id: A1995TK10400002
Scopus-id: 2-s2.0-0029518561
45
76Determination of the optical constants of mgf2 and zns from spectrophotometric measurements and the classical oscillator method2ᵒ autor: Machorro, R., Siqueiros, J.M., Regalado, L.E.1988APPLIED OPTICSWoS-id: A1988P076000028
Scopus-id: 2-s2.0-84975551260
7082
77Determination of (nk) for absorbing thin films using reflectance measurementsCoautor y autor de correspondencia: Machorro, R., Siqueiros, J.M., Regalado, L.E.1988APPLIED OPTICSWoS-id: A1988Q731000025
Scopus-id: 2-s2.0-84975625666
1822
78Repeatability estimate of interference optical filters using thin films process modeling1ᵉʳ autor y autor de correspondencia: Machorro R.1988OPTICS, PHOTONICS, AND DIGITAL TECHNOLOGIES FOR IMAGING APPLICATIONS VIIIScopus-id: 2-s2.0-0024133450
01
79A New Parameter in the ATR Technique for Optical Constants Determination2ᵒ autor: Machorro R., Regalado L.E., Machorro R.1987OPTICS, PHOTONICS, AND DIGITAL TECHNOLOGIES FOR IMAGING APPLICATIONS VIIIScopus-id: 2-s2.0-84901258871
00
80PROCESS MODELING WITH INHOMOGENEOUS THIN FILMS.1ᵉʳ autor: Machorro R., Macleod H.A., Jacobson M.R.1986OPTICS, PHOTONICS, AND DIGITAL TECHNOLOGIES FOR IMAGING APPLICATIONS VIIIScopus-id: 2-s2.0-0023018162
03
81Dip-coating method for fabricating thin photoresist filmsCoautor y autor de correspondencia: Machorro R., Gibson M., Frejlich J.1985Thin Solid FilmsWoS-id: A1985ATM8300014
Scopus-id: 2-s2.0-0022080769
1111
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Documentos no indexados (Humanindex)

# Título del documento ISSN Revista Año Fuente
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Capítulos de libros (WoS y Scopus)

# Título del capítulo Título del libro Autores Alcance Año ISBN Fuente
1Investigating the Modulation of Spectral Properties on a Multilayer Thermochromic Coating for Selective Urban Heat Island MitigationTamayo-Perez U.-J., Machorro-Mejia R., Morales-Inzunza S., et al.Conference Paper20259789819783045Scopus-id: 2-s2.0-85217261142
2Analysis of the Influence of the Spectral Response for Rugate Filters by Modifying the Frequency DomainUltraviolet Self-Diffraction Effects Exhibited By Ion-Implanted Au Nanoparticles In SilicaMachorro-Mejía R., Villa-Flores E., Conference Paper20229781557528209Scopus-id: 2-s2.0-85139148801
3Plasma emission spectroscopy related to the optical properties of silicon oxynitride films for inhomogeneous filtersUltraviolet Self-Diffraction Effects Exhibited By Ion-Implanted Au Nanoparticles In SilicaRodríguez López R., Abundiz Cisneros N., Sanginés de Castro R., et al.Conference Paper20229781557528209Scopus-id: 2-s2.0-85139118575
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No se encuentran registros en la base de datos de obras con ISBN (Indautor).

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Proyectos

# Nombre Participantes Convocatoria Fecha Inicio Fecha Fin
1Diseño y fabricación de filtros interferenciales inhomogéneos.ROBERTO MACHORRO MEJIA,
Recursos CONACYT14-10-201613-10-2019
2Filtro interferencial de baja emisividad para vidrio planoROBERTO MACHORRO MEJIA,
Recursos PAPIIT01-01-201731-12-2019
3Experimentos de fisica en escuelas primarias ruralesROBERTO MACHORRO MEJIA,
Recursos PAPIME01-02-201831-12-2018
4Experimentos de física en escuelas primarias ruralesROBERTO MACHORRO MEJIA,
Recursos PAPIME01-01-201831-12-2020
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No se encuentran registros en la base de datos de comités de tesis.

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Docencia Impartida

# Entidad Nivel Asignatura Año Semestre Alumnos
1Centro de Nanociencias y Nanotecnología en la UNAMMaestríaLABORATORIO AVANZADO20102011-11
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No se encuentran registros en la base de datos de patentes.

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No se encuentran registros en la base de datos de libros completos (Humanindex).

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Capítulos de libros (Humanindex)

# Título del libro Título del capítulo ISBN Editorial Año Fuente